您当前的位置:
首页 >
文章列表页 >
Robustness test method for intelligent electronic device
Network and information security | 更新时间:2024-06-05
    • Robustness test method for intelligent electronic device

    • Telecommunications Science   Vol. 31, Issue Z1, Pages: 125-131(2015)
    • DOI:10.11959/j.issn.1000-0801.2015390    

      CLC: TM774
    • Published Online:20 December 2015,

      Published:20 December 2015

    移动端阅览

  • Haitao JIANG, Bin LI, Xiang WANG, et al. Robustness test method for intelligent electronic device[J]. Telecommunications science, 2015, 31(Z1): 125-131. DOI: 10.11959/j.issn.1000-0801.2015390.

  •  
  •  

0

Views

315

下载量

0

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

An IEC61850 communication model for network devices in smart substation
Protocol security enhancement on secondary system of smart substation
Multilevel tree optical switching network technology in smart substation
All optical-switching technology in transformer substation network
Network security situation awareness technology in smart substation

Related Author

Gaofeng ZHAO
Siyuan HE
Feng DENG
Xiuli HUANG
Zhipeng SHAO
Chen WANG
Yu ZHENG
Xiaojian ZHANG

Related Institution

State Grid Smart Grid Research Institute
Southeast University
State Grid Sichuan Power Research Institute
State Grid Electric Power Research Institute
0